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1
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國立中山大學貴重共同儀器中心
Joint Center for High Valued Instruments at NSYSU
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Instrument Chinese Name
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【EM0000008804】變溫探針顯微鏡
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【EM0000008804】變溫探針顯微鏡
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Instrument English Name
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Atom force microscopy
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Instrument Category
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Electron Microscope
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Instrument Status
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服務(On Service)
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Number of Reservations
(within a month)
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Number of Reservations(Internal):10
Number of Reservations(external):5
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Billing Setting
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2
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國立中山大學貴重共同儀器中心
Joint Center for High Valued Instruments at NSYSU
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Instrument Chinese Name
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【EM0000008806】高解析度探針顯微鏡
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【EM0000008806】高解析度探針顯微鏡
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Instrument English Name
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Atom force microscopy
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Instrument Category
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Electron Microscope
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Instrument Status
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服務(On Service)
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Number of Reservations
(within a month)
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Number of Reservations(Internal):0
Number of Reservations(external):0
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Billing Setting
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3
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國立中山大學貴重共同儀器中心
Joint Center for High Valued Instruments at NSYSU
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Instrument Chinese Name
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【EM0000011300】FEI Tecnai F20 G2 場發射掃描穿透式電子顯微鏡
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【EM0000011300】FEI Tecnai F20 G2 場發射掃描穿透式電子顯微鏡
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Instrument English Name
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FEI Tecnai F20 G2 Field-emission Scanning Transmission Electron Microscope
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Instrument Category
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Electron Microscope
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Instrument Status
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服務(On Service)
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Number of Reservations
(within a month)
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Number of Reservations(Internal):15
Number of Reservations(external):13
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Billing Setting
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4
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國立中山大學貴重共同儀器中心
Joint Center for High Valued Instruments at NSYSU
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Instrument Chinese Name
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【EM0000017100】環境掃描式電子顯微鏡
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【EM0000017100】環境掃描式電子顯微鏡
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Instrument English Name
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Environmental Scanning Electron Microscope
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Instrument Category
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Electron Microscope
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Instrument Status
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服務(On Service)
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Number of Reservations
(within a month)
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Number of Reservations(Internal):0
Number of Reservations(external):0
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Billing Setting
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5
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國立中山大學貴重共同儀器中心
Joint Center for High Valued Instruments at NSYSU
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Instrument Chinese Name
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【EM001500】場發射型掃描式電子顯微鏡
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【EM001500】場發射型掃描式電子顯微鏡
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Instrument English Name
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Field-Emission Scanning Electron Microscope
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Instrument Category
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Electron Microscope
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Instrument Status
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服務(On Service)
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Number of Reservations
(within a month)
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Number of Reservations(Internal):32
Number of Reservations(external):28
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Billing Setting
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6
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國立中山大學貴重共同儀器中心
Joint Center for High Valued Instruments at NSYSU
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Instrument Chinese Name
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【EM001600】JEOL 3010 TEM穿透式電子顯微鏡
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【EM001600】JEOL 3010 TEM穿透式電子顯微鏡
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Instrument English Name
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JEOL 3010 Analytical Scanning Transmission Electron Microscope
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Instrument Category
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Electron Microscope
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Instrument Status
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服務(On Service)
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Number of Reservations
(within a month)
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Number of Reservations(Internal):29
Number of Reservations(external):23
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Billing Setting
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7
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國立中山大學貴重共同儀器中心
Joint Center for High Valued Instruments at NSYSU
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Instrument Chinese Name
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【EM022600】軟物質分析穿透式電子顯微鏡
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【EM022600】軟物質分析穿透式電子顯微鏡
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Instrument English Name
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JEOL JEM-2100 ELECTRON MICROSCOPE
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Instrument Category
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Electron Microscope
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Instrument Status
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服務(On Service)
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Number of Reservations
(within a month)
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Number of Reservations(Internal):0
Number of Reservations(external):0
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Billing Setting
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8
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國立中山大學貴重共同儀器中心
Joint Center for High Valued Instruments at NSYSU
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Instrument Chinese Name
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【EM025100】高階三束型聚焦離子束顯微鏡
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【EM025100】高階三束型聚焦離子束顯微鏡
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Instrument English Name
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Focused Ion and Electron Beam System
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Instrument Category
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Electron Microscope
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Instrument Status
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服務(On Service)
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Number of Reservations
(within a month)
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Number of Reservations(Internal):0
Number of Reservations(external):0
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Billing Setting
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| | | | | | | | | | | |
| Basic | 112 | FIB |
| FIB | 3,000 | 8,000 | 3,000 | 8,000 | No discount |
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| Basic | 112 | FIB(0.25hr) |
| FIB(0.25hr) | 750 | 2,000 | 750 | 2,000 | No discount |
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| Basic | 112 | FIB(Vendor) |
| FIB(Vendor) | 0 | 8,000 | 8,000 | 8,000 | No discount |
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| Basic | 112 | FIB(vendor 0.25hr) |
| FIB(vendor 0.25hr) | 0 | 2,000 | 2,000 | 2,000 | No discount |
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| Basic | 112 | Pt coating |
| Pt coating | 300 | 300 | 300 | 300 | No discount |
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| Basic | 112 | copper grid |
| copper grid | 60 | 60 | 60 | 60 | No discount |
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| Basic | 112 | grid box |
| grid box | 200 | 200 | 0 | 0 | No discount |
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 | Loading… |
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9
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國立中山大學貴重共同儀器中心
Joint Center for High Valued Instruments at NSYSU
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Instrument Chinese Name
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【EM025700】多功能高解析場發射型掃描式電子顯微鏡
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【EM025700】多功能高解析場發射型掃描式電子顯微鏡
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Instrument English Name
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High-Resolution Scanning Electron Microscope
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Instrument Category
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Electron Microscope
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Instrument Status
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服務(On Service)
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Number of Reservations
(within a month)
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Number of Reservations(Internal):49
Number of Reservations(external):18
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Billing Setting
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10
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國立中山大學貴重共同儀器中心
Joint Center for High Valued Instruments at NSYSU
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Instrument Chinese Name
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【EPMA000100】高解析電子微探儀
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【EPMA000100】高解析電子微探儀
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Instrument English Name
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Field Emission Electron Probe Microanalyzer JEOL JXA 8530F
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Instrument Category
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Electron Probe Microanalyzer
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Instrument Status
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服務(On Service)
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Number of Reservations
(within a month)
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Number of Reservations(Internal):0
Number of Reservations(external):0
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Billing Setting
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