Search Center or Instrument

Query Conditions
xv
xv
xv
xv
xv
xv
x
No 
Center Name Ascending
Instrument Informatin Ascending
1 國立中山大學貴重暨共用儀器中心
Joint Center for High Valued Instruments at NSYSU
Instrument Chinese Name 【EM0000008804】變溫探針顯微鏡
Instrument English Name Atom force microscopy
Instrument Category Electron Microscope
Instrument Status 服務(On Service)
Number of Reservations
(within a month)
Number of Reservations(Internal):10
Number of Reservations(external):5
2 國立中山大學貴重暨共用儀器中心
Joint Center for High Valued Instruments at NSYSU
Instrument Chinese Name 【EM0000008806】高解析度探針顯微鏡
Instrument English Name Atom force microscopy
Instrument Category Electron Microscope
Instrument Status 服務(On Service)
3 國立中山大學貴重暨共用儀器中心
Joint Center for High Valued Instruments at NSYSU
Instrument Chinese Name 【EM0000011300】FEI Tecnai F20 G2 場發射掃描穿透式電子顯微鏡
Instrument English Name FEI Tecnai F20 G2 Field-emission Scanning Transmission Electron Microscope
Instrument Category Electron Microscope
Instrument Status 服務(On Service)
Number of Reservations
(within a month)
Number of Reservations(Internal):19
Number of Reservations(external):18
4 國立中山大學貴重暨共用儀器中心
Joint Center for High Valued Instruments at NSYSU
Instrument Chinese Name 【EM0000017100】環境掃描式電子顯微鏡
Instrument English Name Environmental Scanning Electron Microscope
Instrument Category Electron Microscope
Instrument Status 服務(On Service)
5 國立中山大學貴重暨共用儀器中心
Joint Center for High Valued Instruments at NSYSU
Instrument Chinese Name 【EM001500】場發射型掃描式電子顯微鏡
Instrument English Name Field-Emission Scanning Electron Microscope
Instrument Category Electron Microscope
Instrument Status 服務(On Service)
Number of Reservations
(within a month)
Number of Reservations(Internal):61
Number of Reservations(external):28
6 國立中山大學貴重暨共用儀器中心
Joint Center for High Valued Instruments at NSYSU
Instrument Chinese Name 【EM001600】JEOL 3010 TEM穿透式電子顯微鏡
Instrument English Name JEOL 3010 Analytical Scanning Transmission Electron Microscope
Instrument Category Electron Microscope
Instrument Status 服務(On Service)
Number of Reservations
(within a month)
Number of Reservations(Internal):39
Number of Reservations(external):39
7 國立中山大學貴重暨共用儀器中心
Joint Center for High Valued Instruments at NSYSU
Instrument Chinese Name 【EM022600】軟物質分析穿透式電子顯微鏡
Instrument English Name JEOL JEM-2100 ELECTRON MICROSCOPE
Instrument Category Electron Microscope
Instrument Status 服務(On Service)
8 國立中山大學貴重暨共用儀器中心
Joint Center for High Valued Instruments at NSYSU
Instrument Chinese Name 【EM025100】高階三束型聚焦離子束顯微鏡
Instrument English Name Focused Ion and Electron Beam System
Instrument Category Electron Microscope
Instrument Status 服務(On Service)
9 國立中山大學貴重暨共用儀器中心
Joint Center for High Valued Instruments at NSYSU
Instrument Chinese Name 【EM025600】Talos F200X G2 高解析場發射掃描穿透式電子顯微鏡
Instrument English Name Talos F200X G2, High Resolution Field Emission Scanning Electron Microscope
Instrument Category Electron Microscope
Instrument Status 服務(On Service)
Number of Reservations
(within a month)
Number of Reservations(Internal):19
Number of Reservations(external):19
10 國立中山大學貴重暨共用儀器中心
Joint Center for High Valued Instruments at NSYSU
Instrument Chinese Name 【EM025700】多功能高解析場發射型掃描式電子顯微鏡
Instrument English Name High-Resolution Scanning Electron Microscope
Instrument Category Electron Microscope
Instrument Status 服務(On Service)
Number of Reservations
(within a month)
Number of Reservations(Internal):65
Number of Reservations(external):27
第1頁 總頁數:3頁< 上一頁123下一頁 >